Manton, James D.; Ströhl, Florian; Fiolka, Reto; Kaminski, Clemens F.; Rees, Eric J. (Journal article; Tidsskriftartikkel; Peer reviewed, 2020-03-20)
Wide-field fluorescence microscopy, while much faster than confocal microscopy,
suffers from a lack of optical sectioning and poor axial resolution. 3D structured illumination
microscopy (SIM) has been demonstrated to provide optical sectioning and to double the
resolution limit both laterally and axially, but even with this the axial resolution is still worse than
the lateral resolution of ...